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Interaction of intense ultrashort XUV pulses with silicon
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SYSNO 0335956 Title Interaction of intense ultrashort XUV pulses with silicon Title Interakce intenzivních ultra-krátkých XUV pulzů s křemíkem Author(s) Sobierajski, R. (PL)
Klinger, D. (PL)
Jurek, M. (PL)
Pelka, J. B. (PL)
Juha, Libor (FZU-D) RID, ORCID, SAI
Chalupský, Jaromír (FZU-D) RID, ORCID
Cihelka, Jaroslav (FZU-D)
Hájková, Věra (FZU-D) RID, ORCID
Vyšín, Luděk (FZU-D) RID, ORCID
Jastrow, U. (DE)
Stojanovic, N. (DE)
Toleikis, S. (DE)
Wabnitz, H. (DE)
Krzywinski, J. (US)
Hau-Riege, S. (US)
London, R. (US)Source Title Damage to VUV, EUV, and X-ray Optics II. 736107/1-736107/11. - Bellingham : SPIE, 2009 / Juha L. ; Bajt S. ; Sobierajski R. Conference Damage to VUV, EUV, and X-Ray Optics II, Prague, 21.04.2009-23.04.2009 Document Type Konferenční příspěvek (zahraniční konf.) Grant KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) Language eng Country US Keywords radiation damage * amorphization * ablation * monocrystalline silicon * soft x-ray free-electron laser URL http://dx.doi.org/10.1117/12.822152 Permanent Link http://hdl.handle.net/11104/0180297
Number of the records: 1