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Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation
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SYSNO ASEP 0335777 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation Title Prahy poškození různých materiálů ozářených 100-ps pulzy laserového záření o vlnové délce 21,2 nm Author(s) Hájková, Věra (FZU-D) RID, ORCID
Chalupský, Jaromír (FZU-D) RID, ORCID
Wabnitz, H. (DE)
Feldhaus, J. (DE)
Störmer, M. (DE)
Hecquet, Ch. (FR)
Mocek, Tomáš (FZU-D) RID, ORCID, SAI
Kozlová, Michaela (FZU-D) RID, ORCID
Polan, Jiří (FZU-D)
Homer, Pavel (FZU-D) RID
Rus, Bedřich (FZU-D) ORCID
Juha, Libor (FZU-D) RID, ORCID, SAISource Title Damage to VUV, EUV, and X-ray Optics II. - Bellingham : SPIE, 2009 / Juha L. ; Bajt S. ; Sobierajski R. - ISSN 0277-786x - ISBN 9780819476357 Pages 736110/1-736110/6 Number of pages 6 s. Action Damage to VUV, EUV, and X-Ray Optics II Event date 21.04.2009-23.04.2009 VEvent location Prague Country CZ - Czech Republic Event type WRD Language eng - English Country US - United States Keywords soft x-ray laser ; damage to x-ray optics ; laser ablation ; damage thresholds ; single-shot damage Subject RIV BH - Optics, Masers, Lasers R&D Projects KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) Annotation Irradiation experiments were conducted at Prague Asterix Laser System (PALS) with the Ne-like zinc soft x-ray laser (SXRL) at 21.2 nm (58.5 eV) delivering up to 4 mJ (~4 x 1014 photons), 100-ps pulses in a narrowly collimated beam. The thresholds determined with the 100-ps pulses from the plasma-based, quasi-steady state SXRL are significantly higher than the thresholds obtained for 20-fs pulses provided by the SXR free-electron laser in Hamburg. There is a difference in PMMA thresholds of two orders of magnitude for these two sources. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2010
Number of the records: 1