Number of the records: 1  

Profiling N-Type Dopants in Silicon Structures

  1. 1.
    SYSNO ASEP0335497
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleProfiling N-Type Dopants in Silicon Structures
    Author(s) Hovorka, Miloš (UPT-D)
    Mika, Filip (UPT-D) RID, SAI, ORCID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Number of authors3
    Source TitleMikroskopia 2009. - Brno : Tribun EU, 2009 - ISBN 978-80-7399-739-7
    S. 25
    Number of pages1 s.
    ActionMikroskopia 2009
    Event date25.03.2009-26.03.2009
    VEvent locationStará Lesná
    CountrySK - Slovakia
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsGP102/09/P543 GA ČR - Czech Science Foundation (CSF)
    IAA100650803 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2010
Number of the records: 1  

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