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Profiling N-Type Dopants in Silicon Structures
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SYSNO ASEP 0335497 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Profiling N-Type Dopants in Silicon Structures Author(s) Hovorka, Miloš (UPT-D)
Mika, Filip (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 3 Source Title Mikroskopia 2009. - Brno : Tribun EU, 2009 - ISBN 978-80-7399-739-7
S. 25Number of pages 1 s. Action Mikroskopia 2009 Event date 25.03.2009-26.03.2009 VEvent location Stará Lesná Country SK - Slovakia Event type EUR Language eng - English Country CZ - Czech Republic Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GP102/09/P543 GA ČR - Czech Science Foundation (CSF) IAA100650803 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z20650511 - UPT-D (2005-2011) Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2010
Number of the records: 1