Number of the records: 1
Profiling N-Type Dopants in Silicon Structures
- 1.Hovorka, Miloš - Mika, Filip - Frank, Luděk
Profiling N-Type Dopants in Silicon Structures.
Mikroskopia 2009. Brno: Tribun EU, 2009. s. 25. ISBN 978-80-7399-739-7.
[Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
http://hdl.handle.net/11104/0179946
Number of the records: 1