Number of the records: 1  

Profiling N-Type Dopants in Silicon Structures

  1. 1.
    HOVORKA, Miloš, MIKA, Filip, FRANK, Luděk. Profiling N-Type Dopants in Silicon Structures. In: Mikroskopia 2009. Brno: Tribun EU, 2009, s. 25. ISBN 978-80-7399-739-7.
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.