Number of the records: 1
Green Light Interferometry for Metrological SPM Positioning
- 1.0335098 - ÚPT 2010 RIV JP eng C - Conference Paper (international conference)
Lazar, Josef - Klapetek, P. - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Šerý, Mojmír
Green Light Interferometry for Metrological SPM Positioning.
MOC'09 - 15th Microoptics Conference. Tokyo: Microoptics Group (OSJ/JSAP), 2009, s. 232-233. ISBN 978-4-86348-037-7.
[MOC'09 - Microoptics Conference /15./. Tokyo (JP), 25.10.2009-28.10.2009]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/09/1276; GA ČR GA102/07/1179
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning probe microscopy * Nd:YAG laser * green light interferometry
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0179667
Number of the records: 1