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Ionic diffusion and mass discrimination effects in the new generation of short flow tube SIFT-MS instruments
- 1.0329747 - ÚFCH JH 2010 RIV NL eng J - Journal Article
Smith, D. - Pysanenko, A. - Španěl, Patrik
Ionic diffusion and mass discrimination effects in the new generation of short flow tube SIFT-MS instruments.
[Efekty iontové difúze a hmotnostní diskriminace v přístrojích SIFT-MS nové generace s krátkou proudovou trubicí.]
International Journal of Mass Spectrometry. Roč. 281, 1-2 (2009), s. 15-23. ISSN 1387-3806. E-ISSN 1873-2798
R&D Projects: GA ČR GA202/06/0776
Institutional research plan: CEZ:AV0Z40400503
Keywords : SIFT-MS * ionic diffusion * mass discrimination * trace gas analysis
Subject RIV: CF - Physical ; Theoretical Chemistry
Impact factor: 2.117, year: 2009
Permanent Link: http://hdl.handle.net/11104/0175690
Number of the records: 1