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Characterization of polystyrene and doped polymethylmethacrylate thin layers
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SYSNO ASEP 0307936 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Characterization of polystyrene and doped polymethylmethacrylate thin layers Title Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu Author(s) Podgrabinski, T. (CZ)
Hrabovská, E. (CZ)
Švorčík, V. (CZ)
Hnatowicz, Vladimír (UJF-V) RIDSource Title Journal of Materials Science-Materials in Electronics. - : Springer - ISSN 0957-4522
Roč. 16, 11-12 (2005), s. 761-765Number of pages 5 s. Language eng - English Country NL - Netherlands Keywords dielectrical properties Subject RIV BG - Nuclear, Atomic and Molecular Physics, Colliders R&D Projects GA106/03/0514 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10480505 - UJF-V (2005-2011) Annotation About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using a standard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivity epsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2008
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