Number of the records: 1  

To the information depth of the backscattered electron signal

  1. 1.
    SYSNO ASEP0205150
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleTo the information depth of the backscattered electron signal
    Author(s) Frank, Luděk (UPT-D) RID, SAI, ORCID
    Steklý, Richard (UPT-D)
    Zadražil, Martin (UPT-D)
    El Gomati, M. M. (GB)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Source TitleProceedings of the 4th Multinational Congress on Electron Microscopy. - Veszprém : University of Veszprém, 1999
    Pagess. 315-316
    Number of pages2 s.
    ActionMCEM '99 /4./ - Multinational Congress on Electron Microscopy
    Event date05.09.1999-08.09.1999
    VEvent locationVeszprém
    CountryHU - Hungary
    Languageeng - English
    CountryHU - Hungary
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsIPP1067701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2000

Number of the records: 1  

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