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Efect Recognition in Semiconductor Heterostructures on Bevelled Surface

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    0204951 - UPT-D 970085 DE eng A - Abstract
    Srnánek, R. - Škriniarová, J. - Kováč, J. - Frank, Luděk - Novotný, I. - Hotový, I. - Gottschalch, V.
    Efect Recognition in Semiconductor Heterostructures on Bevelled Surface.
    Abstracts of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors DRIP VII. Berlin: Institute of Crystal Growth, 1997. s. 10.8.
    [DRIP /7./. 07.09.1997-10.09.1997, Templin]
    Permanent Link: http://hdl.handle.net/11104/0100571

     
     

Number of the records: 1  

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