Number of the records: 1  

Characterization of polymeric films by ellipsometry

    1.
    SYSNO0185043
    TitleCharacterization of polymeric films by ellipsometry
    Author(s) Švorčík, V. (CZ)
    Tichá, H. (CZ)
    Rybka, V. (CZ)
    Hnatowicz, Vladimír (UJF-V) RID
    Source Title Journal of Materials Science Letters. Roč. 19, - (2000), s. 679-681
    Document TypeČlánek v odborném periodiku
    CEZAV0Z1048901 - UJF-V
    Languageeng
    CountryDE
    Permanent Linkhttp://hdl.handle.net/11104/0081465
     

Number of the records: 1  

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