0185043 - UJF-V 20000213 RIV DE eng J - Journal Article
Švorčík, V. - Tichá, H. - Rybka, V. - Hnatowicz, Vladimír
Characterization of polymeric films by ellipsometry.
Journal of Materials Science Letters. Roč. 19, - (2000), s. 679-681. ISSN 0261-8028
Institutional research plan: CEZ:AV0Z1048901
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 0.496, year: 2000
Permanent Link: http://hdl.handle.net/11104/0081465