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Analysis of Thin Films with Slightly Rough Boundaries
- 1.0180439 - UFCH-W 980169 RIV AT eng J - Journal Article
Ohlídal, I. - Franta, D. - Hora, J. - Navrátil, K. - Weber, Jan - Janda, Pavel
Analysis of Thin Films with Slightly Rough Boundaries.
Microchimica Acta. Roč. 15, Supplement (1998), s. 177-180. ISSN 0026-3672. E-ISSN 1436-5073
R&D Projects: GA AV ČR IAA4040605
Subject RIV: CF - Physical ; Theoretical Chemistry
Impact factor: 0.716, year: 1998
Permanent Link: http://hdl.handle.net/11104/0077112
Number of the records: 1