X-ray emission from thin films on a substrate - Calculation and experiments

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SYSNO ASEP	0134314
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Ostatní články
Title	X-ray emission from thin films on a substrate - Calculation and experiments
Author(s)	Starý, V. (CZ) Jurek, Karel (FZU-D)_{RID, ORCID, SAI}
Source Title	Microchimica Acta. - : Springer - ISSN 0026-3672 Roč. 139, - (2002), s. 179-184
Number of pages	6 s.
Language	eng - English
Country	AT - Austria
Keywords	Monte Carlo simulation ; electron microanalysis ; X-ray emission ; thin films
Subject RIV	BM - Solid Matter Physics ; Magnetism
CEZ	AV0Z1010914 - FZU-D
	MSM 210000021
Annotation	In Monte Carlo code the single crystal scattering model is employed for simulation of X-ray emission from thin films of Au on the Si substrate. The electron beam energy was in the range 10-30keV. These data were compared with experimental values of k-ratios calculated from X-ray intensities of Au M and Au L characteristic lines.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2004

Number of the records: 1