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Optimized polychromatic x-ray imaging with asymmetrically cut bent crystals

  1. 1.
    SYSNO0133995
    NázevOptimized polychromatic x-ray imaging with asymmetrically cut bent crystals
    Tvůrce(i) Podorov, S. G. (DE)
    Renner, Oldřich (FZU-D) RID, ORCID
    Wehrhan, O. (DE)
    Förster, E. (DE)
    Zdroj.dok. Journal of Physics D-Applied Physics. Roč. 34, - (2001), s. 2363-2368. - : Institute of Physics Publishing
    Druh dok.Článek v odborném periodiku
    Grant B508-99027, DE - Německo
    CZE-00-008, XC
    CEZAV0Z1010921 - FZU-D
    Jazyk dok.eng
    Země vyd.GB
    Klíč.slova x-ray imaging * x-ray diffraction * ray-tracing simulations
    Trvalý linkhttp://hdl.handle.net/11104/0031941
     

Number of the records: 1  

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