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Ellipsometric investigations of the refractive index depth profile in PZT thin films
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SYSNO ASEP 0133592 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Ellipsometric investigations of the refractive index depth profile in PZT thin films Author(s) Deineka, Alexander (FZU-D)
Jastrabík, Lubomír (FZU-D) RID, ORCID
Suchaneck, G. (DE)
Gerlach, G. (DE)Source Title Physica Status Solidi A : Applied Research - ISSN 0031-8965
Roč. 188, č. 4 (2001), s. 1549-1552Number of pages 4 s. Language eng - English Country DE - Germany Keywords PZT films ; optical investigations Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA202/00/1425 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z1010914 - FZU-D Annotation Optical investigations of self-polarized PbZr0.235Ti0.765O3 films deposited onto Si/SiO2/adhesion layer/(111) Pt substrate by RF sputtering are presented in this work. Measurements were performed with a spectral ellipsometer working in rotating analyzer mode. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2002
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