Number of the records: 1
Ellipsometric investigations of the refractive index depth profile in PZT thin films
- 1.Deineka, Alexander - Jastrabík, Lubomír - Suchaneck, G. - Gerlach, G.
Ellipsometric investigations of the refractive index depth profile in PZT thin films.
Physica Status Solidi A. Roč. 188, č. 4 (2001), s. 1549-1552. ISSN 0031-8965
R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
Impact factor: 1.025, year: 2001
http://hdl.handle.net/11104/0031555
Number of the records: 1