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Ellipsometric investigations of the refractive index depth profile in PZT thin films

  1. 1.
    Deineka, Alexander - Jastrabík, Lubomír - Suchaneck, G. - Gerlach, G.
    Ellipsometric investigations of the refractive index depth profile in PZT thin films.
    Physica Status Solidi A. Roč. 188, č. 4 (2001), s. 1549-1552. ISSN 0031-8965
    R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
    Impact factor: 1.025, year: 2001
    http://hdl.handle.net/11104/0031555

Number of the records: 1  

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