Number of the records: 1
Ellipsometric investigations of the refractive index depth profile in PZT thin films
SYS 0133592 LBL 02205nam^^2200349^^^450 005 20210715114848.8 101 0-
$a eng 102 $a DE 200 1-
$a Ellipsometric investigations of the refractive index depth profile in PZT thin films 215 $a 4 s. 463 -1
$1 001 cav_un_epca*0257421 $1 011 $a 0031-8965 $1 200 1 $a Physica Status Solidi A $e Applied Research $v Roč. 188, č. 4 (2001), s. 1549-1552 610 1-
$a PZT films 610 1-
$a optical investigations 700 -1
$3 cav_un_auth*0038106 $a Deineka $b Alexander $p FZU-D $w Optical and Biophysical Systems $4 070 $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0100259 $a Jastrabík $b Lubomír $p FZU-D $w Low-Temperature Plasma $4 070 $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0015926 $a Suchaneck $b G. $y DE $4 070 701 -1
$3 cav_un_auth*0016601 $a Gerlach $b G. $y DE $4 070
Number of the records: 1