Number of the records: 1
Electron spin resonance and optical characterization of defects in microcrystalline silicon
- 1.
SYSNO 0132675 Title Electron spin resonance and optical characterization of defects in microcrystalline silicon Author(s) Vaněček, Milan (FZU-D) RID
Poruba, Aleš (FZU-D) RID
Remeš, Zdeněk (FZU-D) RID, ORCID
Rosa, Jan (FZU-D) RID
Kamba, Stanislav (FZU-D) RID, ORCID, SAI
Vorlíček, Vladimír (FZU-D) RID
Meier, J. (CH)
Shah, A. (CH)Source Title Journal of Non-Crystalline Solids. 266-269, - (2000), s. 519-523. - : Elsevier Document Type Článek v odborném periodiku Grant OK 268 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) 4.BPEUJOR3-CT970145, XC CEZ AV0Z1010914 - FZU-D Language eng Country NL Permanent Link http://hdl.handle.net/11104/0030682
Number of the records: 1