Number of the records: 1  

Electron spin resonance and optical characterization of defects in microcrystalline silicon

  1. 1.
    0132675 - FZU-D 20000229 RIV NL eng J - Journal Article
    Vaněček, Milan - Poruba, Aleš - Remeš, Zdeněk - Rosa, Jan - Kamba, Stanislav - Vorlíček, Vladimír - Meier, J. - Shah, A.
    Electron spin resonance and optical characterization of defects in microcrystalline silicon.
    Journal of Non-Crystalline Solids. 266-269, - (2000), s. 519-523. ISSN 0022-3093. E-ISSN 1873-4812
    R&D Projects: GA MŠMT OK 268
    Grant - others:XE(XC) 4.BPEUJOR3-CT970145
    Institutional research plan: CEZ:AV0Z1010914
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.269, year: 2000
    Permanent Link: http://hdl.handle.net/11104/0030682
     

Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.