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Elastic electron backscattering from silicon surfaces: effect of charge-carrier concentration
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SYSNO 0104231 Title Elastic electron backscattering from silicon surfaces: effect of charge-carrier concentration Title Pružný odraz elektronů od povrchu křemíku: vliv koncentrace nosičů náboje Author(s) Zemek, Josef (FZU-D) RID, ORCID
Jiříček, Petr (FZU-D) RID, ORCID, SAI
Lesiak, B. (PL)
Jablonski, A. (PL)Source Title Surface and Interface Analysis. Roč. 36, - (2004), s. 809-811. - : Wiley Document Type Článek v odborném periodiku Grant GA202/02/0237 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z1010914 - FZU-D Language eng Country GB Keywords elastic peak electron spectroscopy(EPES) * inelastic mean free path(IMFP) * elastic electron backscattering probability * charge-carrier concentrations * silicon Permanent Link http://hdl.handle.net/11104/0011506
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