Number of the records: 1
Improved design of a double tilt side entry straining stage for TEM
- 1.Dlabáček, Z., Gemperle, A., Gemperlová, J. Improved design of a double tilt side entry straining stage for TEM. In: EMC 2004. Antverpy: Belgian Society for Microscopy, 2004, s. 417-417.
Number of the records: 1