Introduction to Statistical Pattern Recognition

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SYSNO ASEP	0083049
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Introduction to Statistical Pattern Recognition
Title	Úvod do statistického rozpoznávání
Author(s)	Pudil, Pavel (UTIA-B)_RID Somol, Petr (UTIA-B)_RID Haindl, Michal (UTIA-B)_{RID, ORCID}
Source Title	MATEO - The European Network of Mechatronics Centres and Industrial Controllers 2006. - Plzeň : West Bohemian University, Pilsen, 2006 / Troblova - ISBN 80-7043-508-9
Pages	s. 163-170
Number of pages	8 s.
Action	MATEO - The European Network of Mechatronics Centres and Industrial Controllers 2006
Event date	14.12.2006-16.12.2006
VEvent location	Železná Ruda
Country	CZ - Czech Republic
Event type	EUR
Language	eng - English
Country	CZ - Czech Republic
Keywords	Pattern Recognition
Subject RIV	BD - Theory of Information
CEZ	AV0Z10750506 - UTIA-B (2005-2011)
Annotation	Pattern recognition problem is briefly characterized as a process of machine learning. Its main stages (dimensionality reduction and classifier design) are stated. Statistical approach is given priority here. Two approaches to dimensionality reduction, namely feature selection (FS) and feature extraction (FE) are specified. Though FS is a special case of FE, they are very different from a practical viewpoint and thus must be considered separately.
Workplace	Institute of Information Theory and Automation
Contact	Markéta Votavová, votavova@utia.cas.cz, Tel.: 266 052 201.
Year of Publishing	2007

Number of the records: 1