Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices

0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsanm.1c00204

Precise control of ferroelectric and multiferroic domain states at the nanoscale is of considerable interest due to the potential to boost the development of next-generation low-energy-consumption nanoelectronic components. Progress in this field is closely related to advances in spatially resolved characterization methods. In this regard, scanning electron microscopy (SEM) as a powerful and highly versatile imaging technique with diversified inner detectors possesses huge potential for scale-bridging microscopy studies (spanning from micrometers to nanometers). Here, both the phase variants and the ordered ferroelectric nanodomains of the tetragonal-like (T) phase in the rhombohedral-like (R) and T mixed-phase BiFeO3 nanoscale film are acquired simultaneously using the surface-sensitive scanning low-energy electron microscopy (SLEEM) for the first time. In particular, backscattered electron (BSE) signals, which bring abundant polarization information, can be utilized to discern polarized discrepancy in mixed-phase BiFeO3 nanoscale films. Furthermore, it is demonstrated that the polarization contrast of nanodomains increases with increasing ratio of the low-loss BSEs in the collected signal. Electron trajectories simulation enables us to optimize and separate morphological and polarization contrast in angle-selective BSEs imaging in the presence of a deceleration field. SLEEM combines with other nanocharacterization and fabrication techniques, such as three-dimensional (3D) atom probe tomography, opening up new opportunities for tackling the complex nanoscale physics and defect chemistry of ferroelectric nanomaterials.
Permanent Link: http://hdl.handle.net/11104/0321265