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Small-field dosimetry based on reduced graphene oxide under MeV helium beam irradiation

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    0523740 - ÚJF 2021 RIV GB eng J - Journal Article
    Torrisi, L. - Cutroneo, Mariapompea - Torrisi, Alfio - Silipigni, L. - Havránek, Vladimír
    Small-field dosimetry based on reduced graphene oxide under MeV helium beam irradiation.
    Radiation Effects and Defects in Solids. Roč. 175, 1-2 (2020), s. 120-135. ISSN 1042-0150. E-ISSN 1029-4953
    R&D Projects: GA MŠMT LM2015056; GA ČR(CZ) GBP108/12/G108
    Institutional support: RVO:61389005
    Keywords : dosimeter * reduced graphene oxide * helium ion beam * Gy dose
    OECD category: Nuclear physics
    Impact factor: 1.141, year: 2020
    Method of publishing: Limited access
    https://doi.org/10.1080/10420150.2020.1718137

    A new type of ion dosimeter based on graphene oxide (GO) foils is presented and discussed. GO is biocompatible, stable, tissue equivalent and has special chemical and physical properties. The ion irradiation reduces the material thanks to the breaking of oxygen functional groups bonded to the carbon matrix and to the consequent their desorption. The reduction effect increases the carbon-to-oxygen atomic ratio and transforms the pristine insulator GO into the semiconductive reduced GO (rGO). The reduction increases with the ion dose making the material more electrically conductive, decreasing its band gap and making it denser. At high doses of 2 MeV helium beam irradiation, the electrical conductivity increases linearly with the ion fluence for values within 10(11) and 5 x 10(14) ions/cm(2), corresponding to absorbed doses of 25.9 kGy and 129.55 MGy, respectively. The results indicate that this material reduction is controllable through the desorption of oxygen groups and absorbed hydrogen, by the increment of the electrical conductivity and by the surface roughness, all these parameters depending on the absorbed dose by the material, which can be a good candidate to realise small ion dosimeters, especially to be used in the small-field dosimetry.
    Permanent Link: http://hdl.handle.net/11104/0308038

     
     
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