Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?

0494374 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Rodenburg, C. - Masters, R. - Abrams, K. - Dapor, M. - Krátký, Stanislav - Mika, Filip
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Institutional support: RVO:68081731
Keywords : secondary electrons * polymers * hyperspectral imaging
OECD category: Coating and films

A link between peaks in secondary electron (SE) spectra and Electron Energy Loss Spectra
(EELS) was shown decades ago. Also, materials properties (bulk modulus, band gap)
correlate with the bulk plasmon position in EELS, and local modulus maps in carbon fibres
have been presented. If any features as result of plasmon decay into SE can be identified,
SE spectroscopy combined with hyperspectral imaging could transform the SEM into a tool
for mapping materials properties with ground-breaking potential for nanotechnology. To
become a reality, we first need to establish SE collection conditions spectra that represent a
material reliably. Second, we need to gain a better understanding of the processes involved in the SE emission processes.
Permanent Link: http://hdl.handle.net/11104/0288492