Review of the phenomenon of dips in spectral lines emitted from plasmas and their applications

0487469 - FZÚ 2018 RIV GB eng C - Conference Paper (international conference)
Oks, E. - Dalimier, E. - Faenov, A. Y. - Renner, Oldřich
Review of the phenomenon of dips in spectral lines emitted from plasmas and their applications.
Journal of Physics: Conference Series. Vol. 548. Bristol: IOP Publishing, 2014, s. 1-8, č. článku 012030. ISSN 1742-6588.
[International Conference on Spectral Line Shapes /22./, ICSLS 2014. Tullahoma (US), 01.06.2014-06.06.2014]
Institutional support: RVO:68378271
Keywords : laser-produced plasma * charge-exchange
OECD category: Fluids and plasma physics (including surface physics)

The review covers theoretical and experimental studies of two kinds of dips (local depressions) in spectral line profiles emitted by plasmas: Langmuir-wave-caused dips (L-dips) and charge-exchange-caused dips (X-dips). Positions of L-dips (relative to the unperturbed wavelength of a spectral line) scale with the electron density Ne roughly as Ne1/2, while positions of X-dips are almost independent of Ne. L-dips and X-dips phenomena are interesting and important both fundamentally and practically. The fundamental interest is due to a rich physics behind each of these phenomena. As for important practical applications, they are as follows. Observation of L-dips constitutes a very accurate method to measure the electron density in plasmas – the method that does not require the knowledge of the electron temperature. L-dips also allow measuring the amplitude of the electric field of Langmuir waves.

Permanent Link: http://hdl.handle.net/11104/0282127