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Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

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    0480451 - ÚPT 2018 RIV GB eng J - Journal Article
    Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
    Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.
    Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233. E-ISSN 1361-6501
    R&D Projects: GA ČR GB14-36681G; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 1.685, year: 2017

    We demonstrated that an iodine stabilized distributed Bragg reflector (DBR) diode based laser system lasing at a wavelength in close proximity to lambda = 633 nm could be used as an alternative laser source to the helium-neon lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on an interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano) metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.
    Permanent Link: http://hdl.handle.net/11104/0276231

     
     
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