0470931 - FZÚ 2017 RIV GB eng J - Journal Article
Ondráček, Martin - Hapala, Prokop - Jelínek, Pavel
Charge-state dynamics in electrostatic force spectroscopy.
Nanotechnology. Roč. 27, č. 27 (2016), 1-13, č. článku 274005. ISSN 0957-4484. E-ISSN 1361-6528
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : atomic force microscopy * electron tunneling * redox nanoswitches * electrostatic force spectroscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.440, year: 2016 ; AIS: 0.913, rok: 2016
DOI: https://doi.org/10.1088/0957-4484/27/27/274005

We present a numerical model that allows us to study the response of an oscillating probe in electrostatic force spectroscopy to charge switching in quantum dots at various time scales. The model provides more insight into the behavior of frequency shift and dissipated energy under different scanning conditions when measuring a temporarily charged quantum dot on a surface. Namely, we analyze the dependence of the frequency shift, the dissipated energy, and their fluctuations on the resonance frequency of the tip and on the electron tunneling rates across the tip-quantum dot and quantum dot-sample junctions. We discuss two complementary approaches to simulating the charge dynamics, a stochastic and a deterministic one. In addition, we derive analytic formulas valid for small amplitudes, describing relations between the frequency shift, dissipated energy, and the characteristic rates driving the charging and discharging processes.
Permanent Link: http://hdl.handle.net/11104/0268432