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Crystal structure and magnetic properties of UO.sub.2./sub./permalloy thin films
- 1.0455195 - FZÚ 2016 RIV CH eng J - Journal Article
Tereshina, Evgeniya - Daniš, S. - Springell, R. - Bao, Z. - Havela, L. - Caciuffo, R.
Crystal structure and magnetic properties of UO2/permalloy thin films.
Thin Solid Films. Roč. 591, Sep (2015), s. 271-275. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GP13-25866P
Institutional support: RVO:68378271
Keywords : exchange bias * permalloy * uranium dioxide
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.761, year: 2015
The exchange bias effect was studied on antiferromagnetic-ferromagnetic UO2/permalloy (Ni80Fe20) thin films. Films with a fixed thickness of UO2 layer and variable thickness of the covering Ni80Fe20 layer have been grown by reactive sputter deposition. The X-ray diffraction study showed epitaxial growth of the UO2 layer on (100) CaF2 substrates and a polycrystalline permalloy layer on top of it. The samples exhibited perpendicular exchange bias with the maximum magnitude of 22 mT found in UO2/Ni80Fe20 with the thinnest permalloy of 177 A.
Permanent Link: http://hdl.handle.net/11104/0255835
Number of the records: 1