Influence of ultrathin resin section aging and its reduction for imaging in the low voltage STEM

0452286 - ÚPT 2016 DE eng C - Conference Paper (international conference)
Krzyžánek, Vladislav - Skoupý, Radim - Hrubanová, Kamila - Kočová, L. - Nebesářová, Jana
Influence of ultrathin resin section aging and its reduction for imaging in the low voltage STEM.
MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, s. 817-818.
[Microscopy Conference 2015. Göttingen (DE), 06.09.2015-11.09.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * ultrathin resin
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

A scanning transmission electron microscope (STEM) is a useful device combining features of scanning and transmission electron microscopes. Nowadays, low voltage STEM - here we mean a transmission mode in a SEM that uses, in respect to a commercial STEM, much lower voltages - is increasingly used also for imaging of ultrathin sections. However, many TEM operators consider STEM as a significant source of radiation damage for observation of ultrathin sections; two main features caused by beam damages are the mass loss and the contamination. Both types of damages depend on the used electron energy and the electron dose applied to the sample. In general, the mass loss depends on the sample composition and the contamination results mainly from the poor vacuum in the specimen chamber of the SEM and cleanness of the sample surface. Here, we focus on quantitative investigations of the mass loss of embedding media ultrathin sections in specific aging conditions. Moreover, we discuss our results and propose reduction of the damage for imaging in the low voltage STEM.
Permanent Link: http://hdl.handle.net/11104/0253311