Reciprocal-space mapping for simultaneous determination of texture and stress in thin films

0449326 - FZÚ 2016 RIV GB eng J - Journal Article
Šimek, Daniel - Kužel, R. - Rafaja, D.
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films.
Journal of Applied Crystallography. Roč. 39, č. 4 (2006), s. 487-501. ISSN 0021-8898. E-ISSN 1600-5767
Institutional support: RVO:68378271
Keywords : texture * stress * X-ray diffraction * reciprocal space mapping
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.495, year: 2006

A method of reciprocal-space mapping followed by Rietveld-type refinement of the maps has been developed and tested for strongly textured thin films with fibre texture. The method is particularly useful for simultaneous analysis of stress and texture, expecially in non-cubic materials.
Permanent Link: http://hdl.handle.net/11104/0250882