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Wrinkled SiGe nanofilms as a source of terahertz radiation
- 1.0434615 - ÚT 2015 RIV US eng C - Conference Paper (international conference)
Fedorchenko, Alexander I. - Cheng, H. H. - Koroleva, Anastasia - Wang, W. - Ch.
Wrinkled SiGe nanofilms as a source of terahertz radiation.
ISOT 2014 : International symposium on optomechatronic technologies. Danvers: I E E E Computer Society, 2014 - (Bilof, R.), s. 121-124. ISBN 978-1-4799-6666-0. ISSN 1063-6900.
[ISOT 2014 : International Symposium on Optomechatronic Technologies. Seattle, Washington (US), 05.11.2014-07.11.2014]
R&D Projects: GA MŠMT LH12042
Institutional support: RVO:61388998
Keywords : terahertz radiation * wrinkled SiGe nanofilms * hole oscillation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
DOI: https://doi.org/10.1109/ISOT.2014.37
We demonstrate that the wrinkled Si1–xGex/Si1–y Gey films can serve as radiation sources, which emit electromagnetic waves in a very wide range of the frequencies including the terahertz band from 0.3 to 3 THz. The emission mechanism is based on the change of acceleration of carriers, when they travel along the sinusoidal trajectory in wrinkled Si1– xGex/Si1–yGey films, a manner similar to synchrotron radiation with undulators, or like a free-electron laser.
Permanent Link: http://hdl.handle.net/11104/0239181
Number of the records: 1