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Mechanism of high-resolution STM/AFM imaging with functionalized tips
- 1.0432397 - FZÚ 2015 RIV US eng J - Journal Article
Hapala, Prokop - Kichin, G. - Wagner, C. - Tautz, F.S. - Temirov, R. - Jelínek, Pavel
Mechanism of high-resolution STM/AFM imaging with functionalized tips.
Physical Review. B. Roč. 90, č. 8 (2014), "085421-1"-"085421-9". ISSN 1098-0121
R&D Projects: GA ČR(CZ) GC14-16963J
Grant - others:AVČR(CZ) M100101207
Institutional support: RVO:68378271
Keywords : AFM * STM * high resolution
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.736, year: 2014
High-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing.We present a numerical STM/AFM model, which takes into account the relaxation of the probe due to the tip-sample interaction.
Permanent Link: http://hdl.handle.net/11104/0236765
Number of the records: 1