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Measurement of lattice parameters of single crystals and thin layers
- 1.0432123 - FZÚ 2015 CZ eng A - Abstract
Drahokoupil, Jan - Veřtát, P. - Richterová, Kristina - Laufek, František
Measurement of lattice parameters of single crystals and thin layers.
Materials Structure in Chemistry, Biology, Physics and Technology. Czech and Slovak Crystallographic Association. Roč. 21, č. 2 (2014), s. 97-97. ISSN 1211-5894.
[Struktura 2014 : kolokvium Krystalografické společnosti. 09.06.2014-12.06.2014, Kutná Hora]
Institutional support: RVO:68378271
Keywords : XRD * lattice parameters
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www.xray.cz/ms/bul2014-2/wednesday1.pdf
The precise measurement o lattice parameters plays an important role in determination a temperature of phase transitions or coefficients of thermal expansions. Usually it is performed on a powder or a bulk sample. Although the measurement of single crystals shows some complications, it has also many advantages.
Permanent Link: http://hdl.handle.net/11104/0236601
Number of the records: 1