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Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films
- 1.0392014 - FZÚ 2014 RIV GB eng J - Journal Article
Aulika, I. - Mergen, S. - Bencan, A. - Zhang, Q. - Dejneka, Alexandr - Kosec, M. - Kundzins, K. - Demarchi, D. - Civera, P.
Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films.
Advances in Applied Ceramics. Roč. 112, č. 1 (2013), s. 53-58. ISSN 1743-6753. E-ISSN 1743-6761
R&D Projects: GA TA ČR TA01010517; GA ČR GAP108/12/1941
Institutional research plan: CEZ:AV0Z10100522
Keywords : compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.107, year: 2013
This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.
Permanent Link: http://hdl.handle.net/11104/0220997
Number of the records: 1