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Microscopic study of electronic properties of individual components of nanostructured solar cells
- 1.0386629 - FZÚ 2013 RIV DE eng C - Conference Paper (international conference)
Fejfar, Antonín - Neykova, Neda - Vetushka, Aliaksi - Ledinský, Martin - Itoh, T. - Nakanishi, Y. - Nakamura, S. - Vaněček, Milan - Kočka, Jan
Microscopic study of electronic properties of individual components of nanostructured solar cells.
Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012 - (Nowak, S.), s. 509-511. ISBN 3-936338-28-0.
[European Photovoltaic Solar Energy Conference and Exhibition (PVSEC) /17./. Frankfurt (DE), 24.09.2012-28.09.2012]
R&D Projects: GA MŠMT 7E10061; GA ČR(CZ) GAP108/11/0937; GA MŠMT(CZ) 7E09057; GA MŠMT(CZ) LM2011026; GA MPO FR-TI2/736
EU Projects: European Commission(XE) 240826 - PolySiMode; European Commission(XE) 214134 - N2P
Grant - others:AVČR(CZ) M100101217
Institutional research plan: CEZ:AV0Z10100521
Keywords : silicon thin films * nanostructures * nanowires * conductive atomic force microscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Local electronic properties and photoresponse at nanostructures for solar cells were studied by conductive atomic force microscopy (AFM) in order to assess local electronic properties with resolution down to the nanometre level. Novel approaches addressing the need to measure fragile nanostructures such as ZnO nanorods were demonstrated based on torsional resonance or peak force conductive AFM.
Permanent Link: http://hdl.handle.net/11104/0215978
Number of the records: 1