Multiple Probe Photonic Force Microscopy

0368828 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Jákl, Petr - Šerý, Mojmír - Zemánek, Pavel
Multiple Probe Photonic Force Microscopy.
NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 682-687. ISBN 978-80-87294-27-7.
[NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : photonic force microscopy * scanning probe microscopy * two-photon fluorescence * time-sharing traps
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance.
Permanent Link: http://hdl.handle.net/11104/0203061