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Scanning Very Low Energy Electron Microscopy

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    0368827 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
    Scanning Very Low Energy Electron Microscopy.
    NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
    [NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
    R&D Projects: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

    Recent developments in applications of the scanning very low energy electron microscopy in selected branches of materials science are reviewed. The examples include visualization of grains in conductive polycrystals including ultrafine grained metals, identification of the local crystal orientation upon reflectance of very slow electrons, transmission mode with ultrathin free-standing films including graphene, acquisition of a quantitative dopant contrast in semiconductors, and examination of thin surface coverages.
    Permanent Link: http://hdl.handle.net/11104/0203060

     
     
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