Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O.sub.3./sub. films

0361461 - FZÚ 2012 RIV CH eng J - Journal Article
Suchaneck, G. - Chvostová, Dagmar - Kousal, J. - Železný, Vladimír - Lynnyková, Anna - Jastrabík, Lubomír - Gerlach, G. - Dejneka, Alexandr
Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O₃ films.
Thin Solid Films. Roč. 519, č. 9 (2011), s. 2885-2888. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GC202/09/J017; GA AV ČR KAN301370701; GA MŠMT(CZ) 1M06002; GA ČR GA202/08/1009
Institutional research plan: CEZ:AV0Z10100522
Keywords : PZT film * vacuum-ultraviolet ellipsometry * film structure * optical properties
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.890, year: 2011

In this work we focus on well known interband transitions for the perovskite materials, 2p-->dγ, located in VUV spectral region. Dielectric functions of chemical solution deposited and sputtered PZT were obtained in the spectral range 1-8.8 eV. Differences between the absorption maxima for chemical solution deposited and sputtered PbZrxTi1-xO3 samples near Kahn-Leyendecker 2p-->dγ interband transition were found and are interpreted by change of interatomic distances.
Permanent Link: http://hdl.handle.net/11104/0198769