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Contact system of solid state surface mapping

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    0356357 - FZÚ 2011 RIV CZ eng C - Conference Paper (international conference)
    Hiklová, Helena - Havelková, Martina - Chmelíčková, Hana - Lapšanská, Hana
    Contact system of solid state surface mapping.
    Experimental Stress Analysis 2010. Olomouc: Palacky University, 2010 - (Šmíd, P.; Horváth, P.; Hrabovský, M.), s. 89-93. ISBN 978-80-244-2533-7.
    [International Scientific Conference Experimental Stress Analysis 2010 /48./. Velké Losiny (CZ), 31.05.2010-03.06.2010]
    R&D Projects: GA AV ČR KAN301370701; GA MŠMT(CZ) 1M06002
    Institutional research plan: CEZ:AV0Z10100522
    Keywords : contact sensing * contact profilometer * 3D imaging of solid surfaces
    Subject RIV: BH - Optics, Masers, Lasers
    http://ean2010.upol.cz/site_cs/

    The advantages of contact solid state surface mapping are reminded in this paper. Some possibilities are demonstrated by several examples. These examples include measuring of laser beam treated silicon surface and mapping of laser cuts in metal sheets.
    Permanent Link: http://hdl.handle.net/11104/0194899

     
     
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