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Local electrostatic charging differences of sub-100 nm nanocrystalline diamond films
- 1.0354896 - FZÚ 2011 RIV DE eng J - Journal Article
Verveniotis, Elisseos - Čermák, Jan - Kromka, Alexander - Ledinský, Martin - Remeš, Zdeněk - Rezek, Bohuslav
Local electrostatic charging differences of sub-100 nm nanocrystalline diamond films.
Physica Status Solidi A. Roč. 207, č. 9 (2010), s. 2040-2044. ISSN 1862-6300. E-ISSN 1862-6319
R&D Projects: GA ČR GD202/09/H041; GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
Institutional research plan: CEZ:AV0Z10100521
Keywords : AFM * KFM * SEM * NCD * Raman * charging
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.458, year: 2010
Local electrostatic charging differences of sub-100 nm nanocrystalline diamond films. Atomic force microscopy (AFM) is used to induce electrostatically charged micrometer-sized patterns on the diamond films.
Permanent Link: http://hdl.handle.net/11104/0193799
Number of the records: 1