Study of pixel area variations in fully depleted thick CCD

0354772 - FZÚ 2011 RIV US eng C - Conference Paper (international conference)
Kotov, I.V. - Kotov, A.I. - Frank, J. - Kubánek, Petr - Prouza, Michael - O´Connor, P.O. - Radeka, V. - Takacs, P.
Study of pixel area variations in fully depleted thick CCD.
High Energy, Optical, and Infrared Detectors for Astronomy IV. Bellingham: SPIE, 2010 - (Holland, A.; Dorn, D.), 774206/1-774206/8. Proceedings of the SPIE, 7742. ISBN 9780819482327.
[High Energy, Optical, and Infrared Detectors for Astronomy /4./. San Diego (US), 27.06.2010-04.07.2010]
R&D Projects: GA MŠMT ME09052
Institutional research plan: CEZ:AV0Z10100502
Keywords : CCD * pixel size * charge diffusion
Subject RIV: BF - Elementary Particles and High Energy Physics
http://dx.doi.org/10.1117/12.856519

Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are the source of systematic errors in the flat field calibration procedure. To achieve the calibration accuracy required to meet the most demanding science goals this effect should be taken into account. The study of pixel area variations was performed for fully depleted, thick CCDs produced in a technology study for LSST.
Permanent Link: http://hdl.handle.net/11104/0193694