Optical and structural study of BST multilayers

0354496 - FZÚ 2011 RIV RO eng J - Journal Article
Železný, Vladimír - Chvostová, Dagmar - Pajasová, Libuše - Jelínek, Miroslav - Kocourek, Tomáš - Daniš, S. - Valvoda, V.
Optical and structural study of BST multilayers.
Journal of Optoelectronics and Advanced Materials. Roč. 12, č. 3 (2010), 538-541. ISSN 1454-4164. E-ISSN 1841-7132
R&D Projects: GA ČR GA202/07/0591
Institutional research plan: CEZ:AV0Z10100522; CEZ:AV0Z10100520
Keywords : ellipsometry * structure * ferroelectric multilayers
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 0.412, year: 2010

Ba0.75Sr0.25TiO3/SrTiO3 multilayers were grown by plasma laser deposition on platinized silicon. Their total thickness was about 300 nm and they consisted of 20 double layers each of thickness 8 nm. X-ray diffraction was used for the characterization of sample microstucture, and surface profiler (alpha step) to determine the film thickness and surface roughness. Optical properties of the multilayers were investigated using spectroscopic ellipsometry and normal-incident reflectivity in the spectral range (1 - 14 eV) at room temperature and their temperature dependence using ellipsometry. The optical parameters of the Pt-coated substrates were fitted using the Drude model and then kept fixed in the subsequent calculation. In the transparent range the spectra were modeled by the Cauchy and Urbach formulas. Direct fit procedure and several models were applied to evaluate optical constants and film thickness.
Permanent Link: http://hdl.handle.net/11104/0006268