Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

0352581 - FZÚ 2011 RIV GB eng J - Journal Article
Krása, Josef - Láska, Leoš - Rohlena, Karel - Velyhan, Andriy - Czarnecka, A. - Parys, P. - Ryc, L. - Wolowski, J.
Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources.
Radiation Effects and Defects in Solids. Roč. 165, 6-10 (2010), s. 441-450. ISSN 1042-0150. E-ISSN 1029-4953
R&D Projects: GA MŠMT(CZ) LC528; GA AV ČR IAA100100715
EU Projects: European Commission(XE) 228334 - LASERLAB-EUROPE
Institutional research plan: CEZ:AV0Z10100523
Keywords : laser-produced plasma * time-resolved current deconvolution * ion velocity distribution * drift velocity of ions
Subject RIV: BL - Plasma and Gas Discharge Physics
Impact factor: 0.660, year: 2010

The emission of Fe ions and ionized admixtures of silicon, carbon, oxygen and hydrogen generated by a Nd:YAG laser (I ≈ 1x10^10 W/cm^2) is investigated with the use of ion collectors (IC) and a cylindrical electrostatic ion mass analyzer (CEA). The partial currents of ion species are reconstructed from a set of CEA spectra obtained by changing the voltage between the CEA's cylindrical deflecting plates. The basic difference between the sum of all the reconstructed partial currents and the corresponding IC current is analyzed and the reasons for differences are specified.
Permanent Link: http://hdl.handle.net/11104/0192061