Self Heating of an Atomic Force Microscope

0350712 - ÚFE 2011 RIV CZ eng J - Journal Article
Kučera, Ondřej
Self Heating of an Atomic Force Microscope.
Acta Polytechnica. Roč. 20, č. 1 (2010), s. 9-11. ISSN 1210-2709. E-ISSN 1805-2363
Institutional research plan: CEZ:AV0Z20670512
Keywords : atomic force microscopy
Subject RIV: JB - Sensors, Measurment, Regulation

Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted inluences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still many sources of inherent noise. One of them is selfheating of the apparatus. This paper deals with self{heating of the AFM using an optical lever. This phenomenon is shown to be substantial in particular after activation of the microscope. The inluence on the intrinsic contact noise of AFM's is also examined.
Permanent Link: http://hdl.handle.net/11104/0190642