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Optimization of a bent perfect Si(111) monochromator at a small take-off angle for use in a stress instrument
- 1.0346634 - ÚJF 2011 RIV GB eng J - Journal Article
Seong, B. S. - Em, V. - Mikula, Pavol - Šaroun, Jan - Kang, M.H.
Optimization of a bent perfect Si(111) monochromator at a small take-off angle for use in a stress instrument.
Journal of Applied Crystallography. Roč. 43, č. 3 (2010), s. 654-658. ISSN 0021-8898. E-ISSN 1600-5767
R&D Projects: GA ČR GAP204/10/0654
Institutional research plan: CEZ:AV0Z10480505
Keywords : SENSITIVE NEUTRON DETECTOR * MOSAIC CRYSTALS * DIFFRACTION
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 3.794, year: 2010
The reflectivity and resolution properties of focusing cylindrically bent perfect crystal Si(111) monochromators of different diffraction geometries were tested with the aim of evaluating their possible use in a stress instrument with an unusually small take-off angle (2 theta(M) similar or equal to 30 degrees). The experiments showed that an Si crystal with reflecting planes (111) in the symmetric diffraction geometry provides a maximum figure of merit for accuracy in the peak position that is comparable to that achieved previously from an optimized Si(220) monochromator at 2 theta(M) similar or equal to 55 degrees.
Permanent Link: http://hdl.handle.net/11104/0005992
Number of the records: 1