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Characterization of sensing layer onto the tip tapered fiber
- 1.0345945 - ÚFE 2012 RIV US eng C - Conference Paper (international conference)
Pospíšilová, Marie - Petrášek, Jan - Matějec, Vlastimil - Kašík, Ivan
Characterization of sensing layer onto the tip tapered fiber.
Optical Sensors 2009. Vol. 7356. Bellingham, Washington: SPIE, 2009 - (Baldini, F.; Homola, J.; Lieberman, R.), 735624-1-735624-7. Proceedings of SPIE, 7356. ISBN 9780819476302. ISSN 0277-786X.
[SPIE Europe Optics+Optoelectronics. Praha (CZ), 22.04.2009-23.04.2009]
R&D Projects: GA MŠMT(CZ) LC06034
Institutional research plan: CEZ:AV0Z20670512; CEZ:AV0Z50380511
Keywords : Tapered fibers * fiber sensors
Subject RIV: JB - Sensors, Measurment, Regulation
In this paper we present a novel method for the measurement of the thickness of the sensing layer applied on the tip of a taper. The method is based on analysis of the distribution of the fluorescence intensity over the layer. In experiments the fl uorescence of the layer prepared by the solgel method was investigated be means of a confocal microscope Zeiss LSM5 Duo. This method has made possible to investigate sensing layers with thicknesses of about 1 um.
Permanent Link: http://hdl.handle.net/11104/0187106
Number of the records: 1