Elektronová mikroskopie, mikroanalýza a difrakce na ÚMCH AV ČR

0344043 - ÚMCH 2011 RIV CZ cze J - Journal Article
Šlouf, Miroslav - Pavlova, Ewa - Králová, Daniela - Hromádková, Jiřina - Vlková, Helena - Lapčíková, Monika
Elektronová mikroskopie, mikroanalýza a difrakce na ÚMCH AV ČR.
[Electron microscopy, microanalysis and diffraction at the Institute of Macromolecular Chemistry, Academy of Sciences of the Czech republic.]
Materials Structure in Chemistry, Biology, Physics and Technology. Roč. 17, 2a (2010), k46-k49. ISSN 1211-5894.
[Struktura 2010. Soláň, 14.06.2010-17.06.2010]
R&D Projects: GA AV ČR KAN200520704; GA ČR GAP205/10/0348
Institutional research plan: CEZ:AV0Z40500505
Keywords : introduction to electron microscopy * electron spectroscopy * electron diffraction
Subject RIV: EB - Genetics ; Molecular Biology
http://xray.cz/ms/bul2010-2a/slouf.pdf

Příspěvek popisuje použití elektronové mikroskopie, elektronové spektroskopie a elektronové difrakce pro studium mikrokrystalů a nanokrystalů. Zabývá se následujícími režimy rastrovací (SEM) a transmisní (TEM) elektronové mikroskopie: SEM/SE (secondary electrons imaging v SEM), TEM/BF (bright field imaging v TEM) SEM/EDX, TEM/EDX (energy dispersive analysis of X-rays v SEM a TEM), TEM/SAED (selected area electron diffraction v TEM).

The contribution describes application of electron microscopy on microcrystals and nanocrystals. It deals with the following modes of scanning (SEM) and transmission electron microscopy (TEM): SEM/SE (secondary electrons imaging in SEM), TEM/BF (bright field imaging in TEM) SEM/EDX, TEM/EDX (energy dispersive analysis of X-rays in SEM and TEM), TEM/SAED (selected area electron diffraction in TEM).
Permanent Link: http://hdl.handle.net/11104/0186363