Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP

0341170 - ÚFE 2010 RIV DE eng J - Journal Article
Žďánský, Karel - Zavadil, Jiří - Kacerovský, Pavel - Lorinčík, Jan - Vaniš, Jan - Kostka, František - Černohorský, O. - Fojtík, A. - Reboun, J. - Čermák, Jan
Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP.
International Journal of Materials Research. Roč. 100, č. 9 (2009), s. 1234-1238. ISSN 1862-5282. E-ISSN 2195-8556
Institutional research plan: CEZ:AV0Z20670512; CEZ:AV0Z50200510; CEZ:AV0Z10100521
Keywords : semiconductor junctions * nanostructures * semiconductor devices
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.862, year: 2009

Nanolayers were deposited onto surfaces of n-type InP single crystal wafers by electrophoresis from reverse micelle colloid solutions containing palladium nanoparticles. Two types of nanolayers were deposited, by applying a positive potential or a negative potential on the InP wafer. The nanolayers were studied by capacitance–voltage characteristics, atomic force microscopy, secondary-ion mass spectroscopy and current–voltage characteristics. Correlations among measured characterizations were found.
Permanent Link: http://hdl.handle.net/11104/0184242